Scientific Journal of KubSAU

Polythematic online scientific journal
of Kuban State Agrarian University
ISSN 1990-4665
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Name

Loiko Konstantin Valeryevich

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Freescale Semiconductor
   

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Articles count: 4

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99 kb

A MODEL FOR MINORITY CARRIER MOBILITY IN POLYSILICON EMITTERS

abstract 0901306052 issue 90 pp. 793 – 801 30.06.2013 ru 1581
A model for minority carrier mobility in polysilicon emitter contacts is developed. It is based on the effect of the segregation of electrically active dopants to polysilicon grain boundaries and the thermionic emission - diffusion theory of the hole current. An analytical equation is derived which allows to calculate hole mobility in polysilicon emitter contacts and its dependence on dopant concentration and polysilicon grain size
252 kb

INFLUENCE OF STRESS-DEPENDENT SURFACE GENERATION OF INTERSTITIALS ON STACKING FAULT GROWTH AND DOPANT DIFFUSION IN SILICON

abstract 0901306051 issue 90 pp. 779 – 792 30.06.2013 ru 1473
A model is developed for stress-dependent surface generation and recombination of point defects in silicon. Using the model, such phenomena as stacking fault growth and stress-mediated dopant diffusion in silicon are simulated
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METHODS OF MEASURING FOLLOWER BURNOUT IN THE WORKPLACE

abstract 0901306057 issue 90 pp. 846 – 855 30.06.2013 ru 2123
The article examines two main models of follower burnout in the workplace. Burnout is a chronic stress syndrome that develops over time as a consequence of prolonged stress. Different views on a relationship between burnout and age are presented. Correlations between burnout and Big Five personality factors are discussed
99 kb

POLAR VIEWS ON GLOBALIZATION

abstract 0901306058 issue 90 pp. 856 – 864 30.06.2013 ru 2842
The article presents a phenomenon of globalization and its ramifications. Globalization is a complex and controversial phenomenon of unification and integration. This phenomenon can be defined in multiple ways. The article reviews the origins of the term, economic aspect of globalization, as well as its positive and negative consequences
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